STRANASKA METROLOGY RESEARCH has primary responsibility for the investigation, evaluation and development of state-of-the-art concepts that will sustain Stranaska leadership and innovation in analytical metrology around the world. Stranaska innovation transcends different focus areas including the following:
Science-based analytical instrument qualification of UV-VIS-SWNIR spectrophotometers in FDA-regulated laboratories:
- Spectrophotometric measurement concepts for analytical methodologies and calibration models that can be transferred, tested and implemented in the Metrology Laboratory
- Spectrophotometric reference material artifact standards that can be developed, transferred, tested and certified in the Metrology Laboratory
- Spectrophotometric conceptual models for metrological traceability and measurement uncertainty budgets that can be transferred and implemented in the Metrology Laboratory
Science-based guidance for scientific defensibility, measurement confidence, and assurance of measurement data integrity in FDA-regulated laboratories:
- Harmonization of qualification procedures for analytical spectrophotometers (Jerry Messman, PhD)
- Evaluation of laboratory standard operating procedures for analytical spectrophotometers (Jerry Messman, PhD)
- Scientific training in analytical spectrophotometers and their qualification for laboratory and metrology technicians (Metrology Academy)
Analytical metrology in forensic science (Jerry Messman, PhD)
Senior Research Director: Jerry D. Messman, PhD
Research Measurement Liason: William A. Hartwell
Analytical Instrumentation Leader: Naveen Singh Pradhan
